A design-for-test structure for optimising analogue and mixed signal IC test - researchr publication authors

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A. H. Bratt, Andrew M. D. Richardson, R. J. A. Harvey, A. P. Dorey. A design-for-test structure for optimising analogue and mixed signal IC test. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 24-33, IEEE Computer Society, 1995. [doi]

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