A. H. Bratt, Andrew M. D. Richardson, R. J. A. Harvey, A. P. Dorey. A design-for-test structure for optimising analogue and mixed signal IC test. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 24-33, IEEE Computer Society, 1995. [doi]
@inproceedings{BrattRHD95,
title = {A design-for-test structure for optimising analogue and mixed signal IC test},
author = {A. H. Bratt and Andrew M. D. Richardson and R. J. A. Harvey and A. P. Dorey},
year = {1995},
doi = {10.1109/EDTC.1995.470424},
url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1995.470424},
researchr = {https://researchr.org/publication/BrattRHD95},
cites = {0},
citedby = {0},
pages = {24-33},
booktitle = {1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995},
publisher = {IEEE Computer Society},
isbn = {0-8186-7039-8},
}