Enhancing the efficiency of Bayesian network based coverage directed test generation

Markus Braun, Shai Fine, Avi Ziv. Enhancing the efficiency of Bayesian network based coverage directed test generation. In Ninth IEEE International High-Level Design Validation and Test Workshop 2004, Sonoma Valley, CA, USA, November 10-12, 2004. pages 75-80, IEEE Computer Society, 2004. [doi]

Authors

Markus Braun

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Shai Fine

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Avi Ziv

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