Markus Braun, Shai Fine, Avi Ziv. Enhancing the efficiency of Bayesian network based coverage directed test generation. In Ninth IEEE International High-Level Design Validation and Test Workshop 2004, Sonoma Valley, CA, USA, November 10-12, 2004. pages 75-80, IEEE Computer Society, 2004. [doi]
@inproceedings{BraunFZ04, title = {Enhancing the efficiency of Bayesian network based coverage directed test generation}, author = {Markus Braun and Shai Fine and Avi Ziv}, year = {2004}, doi = {10.1109/HLDVT.2004.1431241}, url = {http://doi.ieeecomputersociety.org/10.1109/HLDVT.2004.1431241}, researchr = {https://researchr.org/publication/BraunFZ04}, cites = {0}, citedby = {0}, pages = {75-80}, booktitle = {Ninth IEEE International High-Level Design Validation and Test Workshop 2004, Sonoma Valley, CA, USA, November 10-12, 2004}, publisher = {IEEE Computer Society}, isbn = {0-7803-8714-7}, }