Johannes Braun 0001, Moritz Horsch, Alexander Wiesmaier. iPIN and mTAN for Secure eID Applications. In Mark Dermot Ryan, Ben Smyth, Guilin Wang, editors, Information Security Practice and Experience - 8th International Conference, ISPEC 2012, Hangzhou, China, April 9-12, 2012. Proceedings. Volume 7232 of Lecture Notes in Computer Science, pages 259-276, Springer, 2012. [doi]
Abstract is missing.