Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes

Alain Bravaix, Florian Cacho, X. Federspiel, C. Ndiaye, S. Mhira, V. Huard. Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. Microelectronics Reliability, 64:163-167, 2016. [doi]

Abstract

Abstract is missing.