Electron Microscopy Experiments Concerning Hysteresis in the Magnetic Lens System

Patrick J. van Bree, C. M. M. van Lierop, P. P. J. van den Bosch. Electron Microscopy Experiments Concerning Hysteresis in the Magnetic Lens System. In Proceedings of the IEEE International Conference on Control Applications, CCA 2010, Yokohama, Japan, September 8-10, 2010. pages 956-961, IEEE, 2010. [doi]

@inproceedings{BreeLB10-0,
  title = {Electron Microscopy Experiments Concerning Hysteresis in the Magnetic Lens System},
  author = {Patrick J. van Bree and C. M. M. van Lierop and P. P. J. van den Bosch},
  year = {2010},
  doi = {10.1109/CCA.2010.5611224},
  url = {http://dx.doi.org/10.1109/CCA.2010.5611224},
  researchr = {https://researchr.org/publication/BreeLB10-0},
  cites = {0},
  citedby = {0},
  pages = {956-961},
  booktitle = {Proceedings of the IEEE International Conference on Control Applications, CCA 2010, Yokohama, Japan, September 8-10, 2010},
  publisher = {IEEE},
  isbn = {978-1-4244-5362-7},
}