Giovanni Breglio, Andrea Irace, E. Napoli, M. Riccio, Paolo Spirito, K. Hamada, T. Nishijima, T. Ueta. Detection of localized UIS failure on IGBTs with the aid of lock-in thermography. Microelectronics Reliability, 48(8-9):1432-1434, 2008. [doi]
@article{BreglioINRSHNU08,
title = {Detection of localized UIS failure on IGBTs with the aid of lock-in thermography},
author = {Giovanni Breglio and Andrea Irace and E. Napoli and M. Riccio and Paolo Spirito and K. Hamada and T. Nishijima and T. Ueta},
year = {2008},
doi = {10.1016/j.microrel.2008.06.042},
url = {http://dx.doi.org/10.1016/j.microrel.2008.06.042},
researchr = {https://researchr.org/publication/BreglioINRSHNU08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1432-1434},
}