Jakub Breier, Dirmanto Jap. Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller. In Stavros Koubias, Thilo Sauter, editors, Proceedings of the 10th Workshop on Embedded Systems Security, WESS 2015, Amsterdam, The Netherlands, October 8, 2015. pages 5, ACM, 2015. [doi]
@inproceedings{BreierJ15,
title = {Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller},
author = {Jakub Breier and Dirmanto Jap},
year = {2015},
doi = {10.1145/2818362.2818367},
url = {http://doi.acm.org/10.1145/2818362.2818367},
researchr = {https://researchr.org/publication/BreierJ15},
cites = {0},
citedby = {0},
pages = {5},
booktitle = {Proceedings of the 10th Workshop on Embedded Systems Security, WESS 2015, Amsterdam, The Netherlands, October 8, 2015},
editor = {Stavros Koubias and Thilo Sauter},
publisher = {ACM},
isbn = {978-1-4503-3667-3},
}