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Processing of bistatic TanDEM-X data

Helko Breit, Thomas Fritz, Ulrich Balss, Andreas Niedermeier, Michael Eineder, Nestor Yague-Martinez, Cristian Rossi. Processing of bistatic TanDEM-X data. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2010, July 25-30, 2010, Honolulu, Hawaii, USA, Proceedings. pages 2640-2643, IEEE, 2010. [doi]

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Helko Breit

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Thomas Fritz

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Ulrich Balss

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Andreas Niedermeier

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Michael Eineder

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Nestor Yague-Martinez

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Cristian Rossi

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