Helko Breit, Thomas Fritz, Ulrich Balss, Andreas Niedermeier, Michael Eineder, Nestor Yague-Martinez, Cristian Rossi. Processing of bistatic TanDEM-X data. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2010, July 25-30, 2010, Honolulu, Hawaii, USA, Proceedings. pages 2640-2643, IEEE, 2010. [doi]
Abstract is missing.