Sébastien Briais, Jean-Michel Cioranesco, Jean-Luc Danger, Sylvain Guilley, David Naccache, Thibault Porteboeuf. Random Active Shield. In Guido Bertoni, Benedikt Gierlichs, editors, 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, Leuven, Belgium, September 9, 2012. pages 103-113, IEEE, 2012. [doi]
Abstract is missing.