Tom Brijs, Gilbert Swinnen, Koen Vanhoof, Geert Wets. Comparing Complete and Partial Classification for Identifying Latently Dissatisfied Customers. In Ramon López de Mántaras, Enric Plaza, editors, Machine Learning: ECML 2000, 11th European Conference on Machine Learning, Barcelona, Catalonia, Spain, May 31 - June 2, 2000, Proceedings. Volume 1810 of Lecture Notes in Computer Science, pages 88-95, Springer, 2000. [doi]
Abstract is missing.