Embedded chipless RFID measurement methodology for microwave materials characterization

Katelyn Brinker, Reza Zoughi. Embedded chipless RFID measurement methodology for microwave materials characterization. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-6, IEEE, 2018. [doi]

Abstract

Abstract is missing.