Automatic fault characterization via abnormality-enhanced classification - researchr publication authors

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Greg Bronevetsky, Ignacio Laguna, Bronis R. de Supinski, Saurabh Bagchi. Automatic fault characterization via abnormality-enhanced classification. In Robert S. Swarz, Philip Koopman, Michel Cukier, editors, IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012, Boston, MA, USA, June 25-28, 2012. pages 1-12, IEEE Computer Society, 2012. [doi]

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