Greg Bronevetsky, Ignacio Laguna, Bronis R. de Supinski, Saurabh Bagchi. Automatic fault characterization via abnormality-enhanced classification. In Robert S. Swarz, Philip Koopman, Michel Cukier, editors, IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012, Boston, MA, USA, June 25-28, 2012. pages 1-12, IEEE Computer Society, 2012. [doi]
@inproceedings{BronevetskyLSB12, title = {Automatic fault characterization via abnormality-enhanced classification}, author = {Greg Bronevetsky and Ignacio Laguna and Bronis R. de Supinski and Saurabh Bagchi}, year = {2012}, doi = {10.1109/DSN.2012.6263926}, url = {http://doi.ieeecomputersociety.org/10.1109/DSN.2012.6263926}, researchr = {https://researchr.org/publication/BronevetskyLSB12}, cites = {0}, citedby = {0}, pages = {1-12}, booktitle = {IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2012, Boston, MA, USA, June 25-28, 2012}, editor = {Robert S. Swarz and Philip Koopman and Michel Cukier}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-1624-8}, }