Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology

Anna Brook, Edison Cristofani, Mathias Becquaert, Ben Lauwens, Joachim Jonuscheit, Marijke Vandewal. Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology. J. Electronic Imaging, 22(2):21004, 2013. [doi]

Abstract

Abstract is missing.