Phil Brothers. New Directions for VLSI Test Systems. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 379-381, IEEE Computer Society, 1983.
@inproceedings{Brothers83,
title = {New Directions for VLSI Test Systems},
author = {Phil Brothers},
year = {1983},
tags = {testing},
researchr = {https://researchr.org/publication/Brothers83},
cites = {0},
citedby = {0},
pages = {379-381},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
publisher = {IEEE Computer Society},
}