Noise characterization of the 0.35 μm CMOS analog process implemented in regular and SOI wafers - researchr publication authors

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Igor Brouk, Yael Nemirovsky. Noise characterization of the 0.35 μm CMOS analog process implemented in regular and SOI wafers. In Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2004, Tel Aviv, Israel, December 13-15, 2004. pages 171-174, IEEE, 2004. [doi]

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