CAEN-BIST: Testing the NanoFabric

Jason G. Brown, R. D. (Shawn) Blanton. CAEN-BIST: Testing the NanoFabric. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 462-471, IEEE, 2004. [doi]

Authors

Jason G. Brown

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R. D. (Shawn) Blanton

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