Measurement and Analysis: What Can and Does Go Wrong?

Maureen Brown, Dennis Goldenson. Measurement and Analysis: What Can and Does Go Wrong?. In 10th IEEE International Software Metrics Symposium (METRICS 2004), 11-17 September 2004, Chicago, IL, USA. pages 131-138, IEEE Computer Society, 2004. [doi]

Authors

Maureen Brown

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Dennis Goldenson

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