Maureen Brown, Dennis Goldenson. Measurement and Analysis: What Can and Does Go Wrong?. In 10th IEEE International Software Metrics Symposium (METRICS 2004), 11-17 September 2004, Chicago, IL, USA. pages 131-138, IEEE Computer Society, 2004. [doi]
@inproceedings{BrownG04,
title = {Measurement and Analysis: What Can and Does Go Wrong?},
author = {Maureen Brown and Dennis Goldenson},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/metrics/2004/2129/00/21290131abs.htm},
tags = {analysis},
researchr = {https://researchr.org/publication/BrownG04},
cites = {0},
citedby = {0},
pages = {131-138},
booktitle = {10th IEEE International Software Metrics Symposium (METRICS 2004), 11-17 September 2004, Chicago, IL, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2129-0},
}