James Brown, Kean Hong Tok, Rui Gao, Zhigang Ji, Weidong Zhang 0002, John S. Marsland, Thomas Chiarella, Jacopo Franco, Ben Kaczer, Dimitri Linten, Jianfu Zhang 0001. A Pragmatic Model to Predict Future Device Aging. IEEE Access, 11:127725-127736, 2023. [doi]
@article{BrownTGJZMCFKLZ23,
title = {A Pragmatic Model to Predict Future Device Aging},
author = {James Brown and Kean Hong Tok and Rui Gao and Zhigang Ji and Weidong Zhang 0002 and John S. Marsland and Thomas Chiarella and Jacopo Franco and Ben Kaczer and Dimitri Linten and Jianfu Zhang 0001},
year = {2023},
doi = {10.1109/ACCESS.2023.3329077},
url = {https://doi.org/10.1109/ACCESS.2023.3329077},
researchr = {https://researchr.org/publication/BrownTGJZMCFKLZ23},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {11},
pages = {127725-127736},
}