James Brown, Kean Hong Tok, Rui Gao, Zhigang Ji, Weidong Zhang 0002, John S. Marsland, Thomas Chiarella, Jacopo Franco, Ben Kaczer, Dimitri Linten, Jianfu Zhang 0001. A Pragmatic Model to Predict Future Device Aging. IEEE Access, 11:127725-127736, 2023. [doi]
Abstract is missing.