Laurent Brunel, Nathalie Malbert, Arnaud Curutchet, Nathalie Labat, B. Lambert. Kink effect characterization in AlGaN/GaN HEMTs by DC and drain current transient measurements. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 270-273, IEEE, 2012. [doi]
Abstract is missing.