Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE

F. Brunner, A. Braun, P. Kurpas, J. Schneider, J. Würfl, M. Weyers. Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE. Microelectronics Reliability, 43(6):839-844, 2003. [doi]

Abstract

Abstract is missing.