Linearity Enhancement Analysis of Breakdown Voltage Doubler and Demonstration in 60 GBd SiGe BiCMOS Driver - researchr publication authors

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Kieran De Bruyn, Tinus Pannier, Jakob Declercq, Laurens Breyne, Xin Yin, Peter Ossieur, Johan Bauwelinck. Linearity Enhancement Analysis of Breakdown Voltage Doubler and Demonstration in 60 GBd SiGe BiCMOS Driver. In IEEE International Symposium on Circuits and Systems, ISCAS 2024, Singapore, May 19-22, 2024. pages 1-5, IEEE, 2024. [doi]

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