Analysis of transconductances at all levels of inversion in deep submicron CMOS

Matthias Bucher, Dimitrios Kazazis, François Krummenacher, David M. Binkley, Daniel Foty, Yannis Papananos. Analysis of transconductances at all levels of inversion in deep submicron CMOS. In Proceedings of the 2002 9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, Dubrovnik, Croatia, September 15-18, 2002. pages 1183-1186, IEEE, 2002. [doi]

Authors

Matthias Bucher

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Dimitrios Kazazis

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François Krummenacher

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David M. Binkley

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Daniel Foty

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Yannis Papananos

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