ODIX: A Rapid Hypotheses Testing System for Origin-Destination Data IEEE VAST Challenge Award for Excellence in Spatio-temporal Graph Analytics

Juri Buchmüller, Wolfgang Jentner, Dirk Streeb, Daniel A. Keim. ODIX: A Rapid Hypotheses Testing System for Origin-Destination Data IEEE VAST Challenge Award for Excellence in Spatio-temporal Graph Analytics. In Brian Fisher, Shixia Liu, Tobias Schreck, editors, 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017, Phoenix, AZ, USA, October 3-6, 2017. pages 197-198, IEEE Computer Society, 2017. [doi]

Abstract

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