Effective coverage as a new metric for image quality assessment databases comparison

Mateusz Buczkowski, Ryszard Stasinski. Effective coverage as a new metric for image quality assessment databases comparison. In International Conference on Systems, Signals and Image Processing, IWSSIP 2017, PoznaƄ, Poland, May 22-24, 2017. pages 1-5, IEEE, 2017. [doi]

Abstract

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