Robust single-shot fringe pattern projection for three-dimensional measurements

B. Budianto, Daniel Pak-Kong Lun, Weiping Zhu. Robust single-shot fringe pattern projection for three-dimensional measurements. In 22nd International Conference on Digital Signal Processing, DSP 2017, London, United Kingdom, August 23-25, 2017. pages 1-5, IEEE, 2017. [doi]

Abstract

Abstract is missing.