Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Mario Jino. Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI. In Jürgen Münch, Matias Vierimaa, editors, Product-Focused Software Process Improvement, 7th International Conference, PROFES 2006, Amsterdam, The Netherlands, June 12-14, 2006, Proceedings. Volume 4034 of Lecture Notes in Computer Science, pages 263-277, Springer, 2006. [doi]
@inproceedings{BuenoCJ06,
title = {Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI},
author = {Paulo Marcos Siqueira Bueno and Adalberto Nobiato Crespo and Mario Jino},
year = {2006},
doi = {10.1007/11767718_23},
url = {http://dx.doi.org/10.1007/11767718_23},
tags = {testing, analysis, process modeling},
researchr = {https://researchr.org/publication/BuenoCJ06},
cites = {0},
citedby = {0},
pages = {263-277},
booktitle = {Product-Focused Software Process Improvement, 7th International Conference, PROFES 2006, Amsterdam, The Netherlands, June 12-14, 2006, Proceedings},
editor = {Jürgen Münch and Matias Vierimaa},
volume = {4034},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-34682-1},
}