Paulo Marcos Siqueira Bueno, W. Eric Wong, Mario Jino. Automatic test data generation using particle systems. In Roger L. Wainwright, Hisham Haddad, editors, Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008. pages 809-814, ACM, 2008. [doi]
@inproceedings{BuenoWJ08,
title = {Automatic test data generation using particle systems},
author = {Paulo Marcos Siqueira Bueno and W. Eric Wong and Mario Jino},
year = {2008},
doi = {10.1145/1363686.1363871},
url = {http://doi.acm.org/10.1145/1363686.1363871},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/BuenoWJ08},
cites = {0},
citedby = {0},
pages = {809-814},
booktitle = {Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008},
editor = {Roger L. Wainwright and Hisham Haddad},
publisher = {ACM},
isbn = {978-1-59593-753-7},
}