Paulo Marcos Siqueira Bueno, W. Eric Wong, Mario Jino. Automatic test data generation using particle systems. In Roger L. Wainwright, Hisham Haddad, editors, Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008. pages 809-814, ACM, 2008. [doi]
Abstract is missing.