Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits - researchr publication related

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Matteo Buffolo, M. Pietrobon, Carlo De Santi, F. Samparisi, Michael L. Davenport, John E. Bowers, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini. Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. Microelectronics Reliability, 88:855-858, 2018. [doi]

The following publications are possibly variants of this publication:

Photonic Integrated Circuits Using Heterogeneous Integration on SiliconTin Komljenovic, Duanni Huang, Paolo Pintus, Minh A. Tran, Michael L. Davenport, John E. Bowers. pieee, 106(12):2246-2257, 2018. [doi]

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