Sharhts S. Bugingo, Peter Freere, Ross Schultz, Frikkie C. De Beer, Xandri van Niekerk. Non-Destructive Imaging of Insulated Gate Bipolar Transistor Power Modules. In 2019 IEEE AFRICON, Accra, Ghana, September 25-27, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.