CHAI: Craters in Historical Aerial Images

Marvin Burges, Sebastian Zambanini, Philipp Pirker. CHAI: Craters in Historical Aerial Images. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2024, Waikoloa, HI, USA, January 3-8, 2024. pages 8241-8250, IEEE, 2024. [doi]

Abstract

Abstract is missing.