Sanjay Burman, Ayan Palchaudhuri, Rajat Subhra Chakraborty, Debdeep Mukhopadhyay, Pranav Singh. Effect of Malicious Hardware Logic on Circuit Reliability. In Hafizur Rahaman, Sanatan Chattopadhyay, Santanu Chattopadhyay, editors, Progress in VLSI Design and Test - 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings. Volume 7373 of Lecture Notes in Computer Science, pages 190-197, Springer, 2012. [doi]
@inproceedings{BurmanPCMS12,
title = {Effect of Malicious Hardware Logic on Circuit Reliability},
author = {Sanjay Burman and Ayan Palchaudhuri and Rajat Subhra Chakraborty and Debdeep Mukhopadhyay and Pranav Singh},
year = {2012},
doi = {10.1007/978-3-642-31494-0_22},
url = {http://dx.doi.org/10.1007/978-3-642-31494-0_22},
researchr = {https://researchr.org/publication/BurmanPCMS12},
cites = {0},
citedby = {0},
pages = {190-197},
booktitle = {Progress in VLSI Design and Test - 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings},
editor = {Hafizur Rahaman and Sanatan Chattopadhyay and Santanu Chattopadhyay},
volume = {7373},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-31493-3},
}