Giovanni Burresi, Martino Lorusso, Lisa Graziani, Alice Comacchio, Federico Trotta, Antonio Rizzo. Image-Based Defect Detection in Assembly Line with Machine Learning. In 10th Mediterranean Conference on Embedded Computing, MECO 2021, Budva, Montenegro, June 7-10, 2021. pages 1-5, IEEE, 2021. [doi]
@inproceedings{BurresiLGCTR21,
title = {Image-Based Defect Detection in Assembly Line with Machine Learning},
author = {Giovanni Burresi and Martino Lorusso and Lisa Graziani and Alice Comacchio and Federico Trotta and Antonio Rizzo},
year = {2021},
doi = {10.1109/MECO52532.2021.9460291},
url = {https://doi.org/10.1109/MECO52532.2021.9460291},
researchr = {https://researchr.org/publication/BurresiLGCTR21},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {10th Mediterranean Conference on Embedded Computing, MECO 2021, Budva, Montenegro, June 7-10, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3912-1},
}