Giovanni Burresi, Martino Lorusso, Lisa Graziani, Alice Comacchio, Federico Trotta, Antonio Rizzo. Image-Based Defect Detection in Assembly Line with Machine Learning. In 10th Mediterranean Conference on Embedded Computing, MECO 2021, Budva, Montenegro, June 7-10, 2021. pages 1-5, IEEE, 2021. [doi]
Abstract is missing.