Evaluating RFID opportunity through process analysis

Davide Busato, Marcello Fera, Raffaele Iannone, Vincenzo Mancini, Massimiliano M. Schiraldi. Evaluating RFID opportunity through process analysis. I. J. RF Technol.: Res. and Appl., 5(1-2):81-105, 2013. [doi]

Abstract

Abstract is missing.