Giovanni Busatto, D. Bisello, Giuseppe Currò, P. Giubilato, Francesco Iannuzzo, S. Mattiazzo, D. Pantano, Annunziata Sanseverino, L. Silvestrin, M. Tessaro, Francesco Velardi, Jeffery Wyss. A new test methodology for an exhaustive study of single-event-effects on power MOSFETs. Microelectronics Reliability, 51(9-11):1995-1998, 2011. [doi]
Abstract is missing.