Ken Butler. Conference Reports: 2005 International Test Conference. IEEE Design & Test of Computers, 23(1):71, 2006. [doi]
@article{Butler06, title = {Conference Reports: 2005 International Test Conference}, author = {Ken Butler}, year = {2006}, doi = {10.1109/MDT.2006.8}, url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.8}, tags = {testing}, researchr = {https://researchr.org/publication/Butler06}, cites = {0}, citedby = {0}, journal = {IEEE Design & Test of Computers}, volume = {23}, number = {1}, pages = {71}, }