Kenneth M. Butler. Guest Editor s Introduction: ITC Helps Get More Out of Test. IEEE Design & Test of Computers, 23(5):388-389, 2006. [doi]
@article{Butler06a,
title = {Guest Editor s Introduction: ITC Helps Get More Out of Test},
author = {Kenneth M. Butler},
year = {2006},
doi = {10.1109/MDT.2006.120},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.120},
tags = {testing},
researchr = {https://researchr.org/publication/Butler06a},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {23},
number = {5},
pages = {388-389},
}