Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena. Modeling Test Escape Rate as a Function of Multiple Coverages. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-9, IEEE, 2008. [doi]
@inproceedings{ButlerCS08,
title = {Modeling Test Escape Rate as a Function of Multiple Coverages},
author = {Kenneth M. Butler and John M. Carulli Jr. and Jayashree Saxena},
year = {2008},
doi = {10.1109/TEST.2008.4700605},
url = {http://dx.doi.org/10.1109/TEST.2008.4700605},
researchr = {https://researchr.org/publication/ButlerCS08},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008},
editor = {Douglas Young and Nur A. Touba},
publisher = {IEEE},
isbn = {978-1-4244-2403-0},
}