Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena. Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 934, IEEE Computer Society, 1996.
@inproceedings{ButlerJPJS96,
title = {Integrating Automated Diagnosis into the Testing and Failure Analysis Operations},
author = {Kenneth M. Butler and Karl Johnson and Jeff Platt and Anjali Jones and Jayashree Saxena},
year = {1996},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/ButlerJPJS96},
cites = {0},
citedby = {0},
pages = {934},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}