J. Adam Butts, Gurindar S. Sohi. Characterizing and predicting value degree of use. In Proceedings of the 35th Annual International Symposium on Microarchitecture, Istanbul, Turkey, November 18-22, 2002. pages 15-26, ACM/IEEE, 2002. [doi]
@inproceedings{ButtsS02:0,
title = {Characterizing and predicting value degree of use},
author = {J. Adam Butts and Gurindar S. Sohi},
year = {2002},
doi = {10.1145/774861.774864},
url = {http://doi.acm.org/10.1145/774861.774864},
researchr = {https://researchr.org/publication/ButtsS02%3A0},
cites = {0},
citedby = {0},
pages = {15-26},
booktitle = {Proceedings of the 35th Annual International Symposium on Microarchitecture, Istanbul, Turkey, November 18-22, 2002},
publisher = {ACM/IEEE},
isbn = {0-7695-1859-1},
}