Leakage Analysis Considering the Effect of Inter-Cell Wire Resistance for Nanoscaled CMOS Circuits

Paulo F. Butzen, Vinícius Dal Bem, André Inácio Reis, Renato P. Ribas. Leakage Analysis Considering the Effect of Inter-Cell Wire Resistance for Nanoscaled CMOS Circuits. J. Low Power Electronics, 6(1):192-200, 2010. [doi]

Abstract

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