Simple and accurate method for fast static currentestimation in cmos complex gates with interaction ofleakage mechanisms

Paulo F. Butzen, Leomar S. da Rosa Jr., Erasmo J. D. Chiappetta Filho, Dionatan S. Moura, André Inácio Reis, Renato P. Ribas. Simple and accurate method for fast static currentestimation in cmos complex gates with interaction ofleakage mechanisms. In Vijay Narayanan, Zhiyuan Yan, Enrico Macii, Sanjukta Bhanja, editors, Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008. pages 407-410, ACM, 2008. [doi]

@inproceedings{ButzenRFMRR08,
  title = {Simple and accurate method for fast static currentestimation in cmos complex gates with interaction ofleakage mechanisms},
  author = {Paulo F. Butzen and Leomar S. da Rosa Jr. and Erasmo J. D. Chiappetta Filho and Dionatan S. Moura and André Inácio Reis and Renato P. Ribas},
  year = {2008},
  doi = {10.1145/1366110.1366207},
  url = {http://doi.acm.org/10.1145/1366110.1366207},
  researchr = {https://researchr.org/publication/ButzenRFMRR08},
  cites = {0},
  citedby = {0},
  pages = {407-410},
  booktitle = {Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008},
  editor = {Vijay Narayanan and Zhiyuan Yan and Enrico Macii and Sanjukta Bhanja},
  publisher = {ACM},
  isbn = {978-1-59593-999-9},
}