Sergey Bychikhin, Viktor Dubec, Dionyz Pogany, Erich Gornik, M. Graf, V. Dudek, Winfried Soppa. Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress. Microelectronics Reliability, 44(9-11):1687-1692, 2004. [doi]
Abstract is missing.